The scanning near-field optical microscope (SNOM) is suitable for mapping the optical near field of illuminated samples in different excitation geometries (reflection and transmission).
|
Contact person |
Judit Budai |
|---|
The scanning near-field optical microscope (SNOM) is suitable for mapping the optical near-field of illuminated samples in different excitation geometries, namely in reflection and transmission. The reflection mode allows one to determine the local differences in the optical properties, while transmission mode enables the investigation of plasmonic near fields of metallic nanostructures. The microscope is also available for characterising surface topography with tapping mode AFM.
The scanning scattering near-field microscope (VIS-neaSCOPE+s system) allows the investigation of local interactions between light and solid surfaces. The device is suitable for mapping the optical near field of the samples in different excitation geometries (reflection and transmission) with a resolution in the order of nanometers with different excitation sources. The device enables studying local changes in optical porperties, exciton-polariton propagation and surface plasmon polaritons.
Measurement principle of SNOM device:
|
Wavelengths |
1550 nm |
633 nm |
533 nm |
|---|---|---|---|
|
Corresponding CW-power |
20 mW |
10 mW |
10 mW |
|
Measurement configuration |
Reflection and transmission |
||
|
Lateral scanning range |
min. 90x90µm |
||
|
Vertical scanning range |
min. 2µm |
||
|
Sample size |
min. 9x9x1mm |
||
Samples larger than 9 mm x 9 mm x 1 mm can be handled.
Interferometric detection of near-field is ensured with full (complete) background suppression using Pseudo Heterodyne method with Michelson and Mach-Zender type arrangements.