Optical Workshops, Metrology
Spectrophotometry (R% & T%)
Spectrophotometer UV-Vis-NIR
PerkinElmer Lambda 1050 equipped with
- URA (Universal Reflectance Accessory) AOI=8÷65°
- DRA (Diffuse Reflectance Accessory), ø60mm and ø150mm integrating sphere
- Three Detector Module for T% measurements, AOI=0°
- 175-3300nm
- D2+W-H → PbS+PMT+InGaS
Interferometry
ZYGO Laser interferometer (@HeNe) for surface form
Equipped with
λ/20@633nm reference plan/sphere for AR and HR coated optics respectively (no compromise with attenuators)
Optical coatings / systems
Spectroscopic Ellipsometry by SEMILAB (former Sopra)
- Phase and phase-shift characterisation
- UV-Vis-NIR range (193-1690nm)
- Complex indices investigation
- Anisotopic measurements
- Surface morphology and coating stack structures
Measuring equipment for Lenses and Optical systems
- +/- FL as well as BFL
- CX and CC radii
- Parallelism/wedge
Custom systems
in-house developed systems
Equipped with
- Sources (WL, stab. HeNe, photodiodes, supercontinuum)
- Detectors (spectrometers for Vis-NIR range)
Optical Preparatory Workshops
Component manufacturing
Custom optical components (Plano & Prims)
- Dia. 11-200mm / edge length 22-80 mm
- glass, FS, certain metals, ceramics, monocrystals to be processed
- NC controlled optic cutter (low kerf-loss), 5-axis CNC fine-grinding, traditional lever and polising machines (for PUR ), laser interferometer...
... What we utilize and develop so far.
Design, characterization and deposition
Custom multilayer designs and coatings
- We can design stacks by ourselves using OptiLayer Software from single layer characterisation to post-production engineering
- Dieletric/ Metal/ Hybrid multilayers are possible to deposit
- Equipped with resistance sources, e-beam, ion-assisted and sputter (DC/RF) deposition sources
- Different substrate holders to fit various substrate attributes
Capabilities, limitations
